Photo-oxidation-modulated refractive index in Bi2Te3thin films
نویسندگان
چکیده
منابع مشابه
Comparative study of photo-induced variations of X-ray diffraction and refractive index in photo-thermo-refractive glass
Spontaneous and photo-induced crystallization have been investigated in fluorinated silicate glass by means of X-ray diffraction and optical interferometry. This glass is a photo-sensitive material for high-efficiency phase volume hologram recording. Variations of a refractive index in this glass are controlled by UV irradiation followed by a thermal development which is photo-thermo-refractive...
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Photo-thermo-refractive (PTR) glass is a photosensitive multicomponent silicate glass containing photosensitive agents such as cerium and silver. Photoinduced crystalline phase precipitation results in refractive index variations in exposed areas of PTR glass, which has been successfully used for phase hologram recording. Photosensitivity being the result of the partial absorption of the exposi...
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A prism coupling method was used to measure the ordinary (no) and extraordinary (ne) refractive indices of AlxGa12xN films, grown by hydride vapor phase epitaxy ~HVPE! and metalorganic chemical vapor deposition ~MOCVD! on sapphire, at several discrete wavelengths from 442 nm to 1064 nm. In addition, spectroscopic transmittance and reflectance, correlated with the prism coupling results, were us...
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GaN is an excellent host for erbium (Er) to provide optical emission in the technologically important as well as eye-safe 1540 nm wavelength window. Er doped GaN (GaN:Er) epilayers were synthesized on c-plane sapphire substrates using metal organic chemical vapor deposition. By employing a pulsed growth scheme, the crystalline quality of GaN:Er epilayers was significantly improved over those ob...
متن کاملSimple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films.
In the standard M-line method for the characterization of graded-index film, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which ...
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ژورنال
عنوان ژورنال: Materials Research Express
سال: 2017
ISSN: 2053-1591
DOI: 10.1088/2053-1591/aa9c94